TopoMetric Explorer Atomic Force Microscope (AFM) Scanner Unit w/ Wooden Box

This item was removed from a facility where it was surplus to requirement. It is in good cosmetic condition, with its original packaging. We are unable to test it at our facility. It is a precision component used for high-resolution surface characterisation in atomic force microscopy. This unit enables nanometer-scale scanning and imaging of surfaces and is designed for integration with compatible AFM control systems.