Hitachi S-2600N Scanning Electron Microscope + Oxford X-Max 50 mm² Inca Detector

Hitachi S-2600N Scanning Electron Microscope with Oxford X-Max 50 mm² INCA Detector. This system was removed from a facility where it was surplus to requirement. The system is reported to be in good working order and was in active use prior to removal. This Hitachi S-2600N SEM is fitted with an Oxford Instruments X-Max 50 mm² INCA detector system. According to the previous owner, the instrument has been serviced every 6 months due to strict UKAS operational standards, although annual servicing is generally considered standard practice within the industry. Service records from the last service carried out in August 2025 may be available.